المسار :OKDatasheet > اشباه الموصلات datasheet > TI Datasheet > SNJ54BCT8373AFK
SNJ54BCT8373AFK المضاربه : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK مماثلة
- SNJ5400J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5400WA
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES
- SNJ5401J
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5401W
- QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402J
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
- SNJ5402W
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SNJ54BCT8373AFK Datasheet والمضاربه
الصانع : TI
التعبءه : FK
دبابيس : 28
درجة الحراره : دقيقة -55 °C | الاقصى 125 °C
حجم : 323 KB
التطبيق : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK تحميل PDF
