SNJ54ABT8543JT مماثلة

  • SNJ5400J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5400WA
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES
  • SNJ5401J
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5401W
    • QUADRUPLE 2-INPUT POSITIVE-NAND GATES WITH OPEN-COLLECTOR OUTPUT
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402J
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES
  • SNJ5402W
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SNJ54ABT8543JT Datasheet والمضاربه

الصانع : TI 

التعبءه : JT 

دبابيس : 28 

درجة الحراره : دقيقة -55 °C | الاقصى 125 °C

حجم : 392 KB

التطبيق : SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANCEIVERS 

SNJ54ABT8543JT تحميل PDF

SNJ54ABT8543JT PDF