SN74ALVTH162827VR مماثلة

  • SN74BCT8374ADWR
    • SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
  • SN74ABT623N
    • OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
  • SN74AHC541PWR
    • OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
  • SN74S260D
    • DUAL 5-INPUT POSITIVE-NOR GATES
  • SN74LVTH16652DLR
    • 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
  • SN7405N3
    • HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
  • SN74AHC74PWLE
    • DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
  • SN74HC02DBR
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ALVTH162827VR Datasheet والمضاربه

الصانع : TI 

التعبءه : DGV 

دبابيس : 56 

درجة الحراره : دقيقة -40 °C | الاقصى 85 °C

حجم : 189 KB

التطبيق : 2.5-V/3.3-V 20-BIT BUFFERS/DRIVERS WITH 3-STATE OUTPUTS 

SN74ALVTH162827VR تحميل PDF

SN74ALVTH162827VR PDF