SN74ABT16374ADL مماثلة

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    • SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
  • SN74ABT623N
    • OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
  • SN74AHC541PWR
    • OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
  • SN74S260D
    • DUAL 5-INPUT POSITIVE-NOR GATES
  • SN74LVTH16652DLR
    • 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
  • SN7405N3
    • HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
  • SN74AHC74PWLE
    • DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
  • SN74HC02DBR
    • QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74ABT16374ADL Datasheet والمضاربه

الصانع : TI 

التعبءه : DL 

دبابيس : 48 

درجة الحراره : دقيقة -40 °C | الاقصى 85 °C

حجم : 119 KB

التطبيق : 16-BIT EDGE-TRIGGERED D-TYPE FFLIP-FLOPS WITH 3-STATE OUTPUTS 

SN74ABT16374ADL تحميل PDF

SN74ABT16374ADL PDF